کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1687567 | 1010670 | 2008 | 4 صفحه PDF | دانلود رایگان |
![عکس صفحه اول مقاله: Measurements with compound refractive lenses at the “BAMline” Measurements with compound refractive lenses at the “BAMline”](/preview/png/1687567.png)
A set of compound refractive lenses (CRLs), mounted on a silicon wafer, was obtained from the Institut für Mikrostrukturtechnik Karlsruhe. The CRLs were characterized at the BAMline at the synchrotron BESSYII in Berlin. It could be demonstrated that beam diameters below 1 μm can be obtained. The beam size accepted by the lenses is (140 × 140) μm2, thus the intensity gain in the micrometer spot, including absorption, is about 15,000. It is possible to switch between different beam energies within a few minutes. First results of scans and the application of the lenses for MicroXANES (X-ray absorption near-edge structure) measurements are presented in this paper. Also, the possibility of MicroEXAFS (extended X-ray absorption fine structure) measurements is discussed.
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 266, Issue 10, May 2008, Pages 2165–2168