کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1688064 1010715 2006 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Nanometer-scale mechanism of phase-change optical recording as revealed by XAFS
کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
Nanometer-scale mechanism of phase-change optical recording as revealed by XAFS
چکیده انگلیسی

We demonstrate that the Ge(Sb)–Te bond lengths in crystallized cubic Ge2Sb2Te5 (GST) are significantly lower than the values expected from the previous X-ray diffraction (XRD) analysis. At the same time, the second nearest-neighbour Te–Te distances are in perfect agreement with XRD. We conclude that the structure of GST is a distorted rocksalt structure. Upon amorphization, Ge–Te and Sb–Te bonds get shorter and stronger. This unusual behaviour is due to a switch of Ge atom from an octahedral symmetry position in the crystalline state into a tetrahedral symmetry position in the amorphous state. It is this switching of the Ge atoms that is responsible for the fast and stable media performance.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 246, Issue 1, May 2006, Pages 69–74
نویسندگان
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