کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1688064 | 1010715 | 2006 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Nanometer-scale mechanism of phase-change optical recording as revealed by XAFS
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
We demonstrate that the Ge(Sb)–Te bond lengths in crystallized cubic Ge2Sb2Te5 (GST) are significantly lower than the values expected from the previous X-ray diffraction (XRD) analysis. At the same time, the second nearest-neighbour Te–Te distances are in perfect agreement with XRD. We conclude that the structure of GST is a distorted rocksalt structure. Upon amorphization, Ge–Te and Sb–Te bonds get shorter and stronger. This unusual behaviour is due to a switch of Ge atom from an octahedral symmetry position in the crystalline state into a tetrahedral symmetry position in the amorphous state. It is this switching of the Ge atoms that is responsible for the fast and stable media performance.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 246, Issue 1, May 2006, Pages 69–74
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 246, Issue 1, May 2006, Pages 69–74
نویسندگان
A.V. Kolobov, P. Fons, J. Tominaga, A.I. Frenkel, A.L. Ankudinov, T. Uruga,