کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1688084 1010715 2006 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Resonant inelastic X-ray scattering applied to the electronic structure of strongly correlated systems: The YBCO case
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
Resonant inelastic X-ray scattering applied to the electronic structure of strongly correlated systems: The YBCO case
چکیده انگلیسی

Resonant inelastic soft X-ray scattering is a developing technique well suited to the study of correlation effects in complex materials. We briefly describe its potential for materials science and illustrate its sensitivity with a study of elementary excitations at Cu sites in YBa2Cu3O7−δ as a function of oxygen content. High resolution measurements at the Cu 2p edge reveal structure that, with the help of theoretical models, can be interpreted as due to d–d excitations of the type 3d (x2 − y2) to 3d (3z2 − r2), Zhang–Rice singlets, and changes in the Cu spin configuration.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms - Volume 246, Issue 1, May 2006, Pages 176–179
نویسندگان
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