کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1689292 1011224 2010 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
How the sensitivity in PIXE elemental analysis is affected by the type of particle, cross-sections, background radiation and other factors?
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
How the sensitivity in PIXE elemental analysis is affected by the type of particle, cross-sections, background radiation and other factors?
چکیده انگلیسی

The purpose of this paper is to review the relevant factors to be taken into account to obtain a more sensitive PIXE (Particle induced X-ray emission) elemental analysis. In quantitative PIXE analysis, matrix effects become a fundamental factor. Depending on the analyzed element, the projectile particle type and its energy, material composition can have a major effect on the X-ray yields. Background in the X-ray spectrum, detection limits, particle stopping powers and X-ray photons attenuation, should be considered. Also the ionization cross-sections could be affected by the previous state of the projectile, conditioned by the passage in the material producing multiple ionizations and changes in its state of charge. A variety of experimental results and theoretical models, are analyzed here for protons, deuterons and heavier incident ions.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Vacuum - Volume 84, Issue 10, 19 May 2010, Pages 1250–1253
نویسندگان
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