Reducing structural change in aluminum coated polyethylene naphthalate foils during MeV proton irradiation

Structural change in polyethylene naphthalate (PEN) foil during MeV proton beam irradiation was investigated by ion beam induced luminescence (IBIL). An aluminum thin film (thickness: 20 nm) was sputter-deposited on the upper surface of 4 μm thick PEN foil to evaluate how Al coating effects structural change. IBIL analysis reveals that the Al coating clearly reduces damage induced by ion beam irradiation, probably due to the enhancement of electrical conductivity of the foil.

► Al coating reduces degradation of PEN foil irradiated with MeV proton.
► Ion beam induced luminescence reveals structural changes in PEN and Al/PEN.
► The degradation is suppressed by the enhancement of electrical conductivity.