کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1690490 | 1518956 | 2015 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
A model for quantification of GDOES depth profiles
دانلود مقاله + سفارش ترجمه
دانلود مقاله ISI انگلیسی
رایگان برای ایرانیان
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: A model for quantification of GDOES depth profiles A model for quantification of GDOES depth profiles](/preview/png/1690490.png)
چکیده انگلیسی
• The MRI-CRAS model is developed for GDOES depth profile quantification.
• The roughness effect and the crater effect are quantitatively considered.
• The model is applied to quantify measured N-and Ni-depth profiles of coatings.
The MRI (Mixing-Roughness-Information depth) model and the CRAS (Crater-Simulation) model are combined for the quantification of GDOES (glow discharge optical emission spectroscopy) depth profile by taking into account the effects of crater, roughness and preferential sputtering in depth profiling. This combined model is successfully applied for the quantification of the measured GDOES depth profiles of N in a nitride coating and of Ni in a Ni-coated copper substrate.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Vacuum - Volume 113, March 2015, Pages 5–10
Journal: Vacuum - Volume 113, March 2015, Pages 5–10
نویسندگان
Y. Liu, W.H. Yu, J.Y. Wang,