کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1690553 1011263 2006 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Physical characteristics of thermally evaporated Bismuth thin films
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
Physical characteristics of thermally evaporated Bismuth thin films
چکیده انگلیسی

Thin films of bismuth with different thicknesses were produced by thermal evaporation from a molybdenum boat source onto cleaned glass substrates at room temperature. The material has been characterized using X-ray diffraction, electrical and optical measurements. A polycrystalline transition phase was observed. The resistivity was calculated for different film thicknesses and found to vary with thickness and temperature. An anomalous dependence of resistivity on temperature was observed during heating. The optical constants were determined from the transmission and reflection data of these thin films for normal incidence. The absorption coefficient revealed the existence of an allowed direct transition with energy gap (Eg) values ranging from 3.45 to 3.6 eV.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Vacuum - Volume 80, Issue 8, 9 June 2006, Pages 860–863
نویسندگان
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