Study of the ability to field emission from diamond-like carbon layers and carbon nanotubes

Atomic force microscopy (AFM) and Raman spectroscopy were used to investigate the physical and chemical parameters of DLC films after deposition process. The electrical parameters of capacitors with the DLC layer as an insulator were extracted from the capacitance-voltage (C-V) and current-voltage (I-V) characteristics. Measurements of the field emission were performed after characterization of the layer properties.