کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1691374 1011311 2008 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Optical characterization of vacuum evaporated a-Se80Te20−xCux thin films
موضوعات مرتبط
مهندسی و علوم پایه مهندسی مواد سطوح، پوشش‌ها و فیلم‌ها
پیش نمایش صفحه اول مقاله
Optical characterization of vacuum evaporated a-Se80Te20−xCux thin films
چکیده انگلیسی
Thin films of a-Se80Te20−xCux (where x=2, 6, 8 and 10) were deposited on glass substrates by vacuum evaporation technique. The absorbance, reflectance and transmittance of as-deposited thin films were measured in the wavelength region 400-1000 nm. The optical band gap and optical constants of amorphous thin films have been studied as a function of photon energy. The optical band gap increases on incorporation of copper in Se80Te20−xCux system. The value of refractive index (n) decreases while the value of the extinction coefficient (k) increases with increasing photon energy. The results are interpreted in terms of concentration of localized states.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Vacuum - Volume 82, Issue 6, 19 February 2008, Pages 608-612
نویسندگان
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