کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1691529 | 1011319 | 2009 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
XPS studies of perovskites surface instability caused by Ar+ ion and electron bombardment and metal deposition
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی مواد
سطوح، پوششها و فیلمها
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چکیده انگلیسی
X-ray Photoelectron Spectroscopy (XPS) was used to study the influence of low energy Ar+ ion bombardment, electron bombardment and Pt deposition on the SrTiO3 (STO) single crystal electronic structure. Atomic composition changes were found and attributed to chemical reconstruction of the STO surface. A clear correlation between the presence of conducting, low Ti oxidation states in valence band and core level changes was detected. A strong effect caused by electron irradiation was ascribed to the electroreduction process. The influence of lanthanum doping on surface instability of STO was also discussed. The La doped sample (STO: 3,75% La) was found to be modified upon Pt metal deposition to a higher degree than pure STO crystal.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Vacuum - Volume 83, Supplement 1, 1 May 2009, Pages S69–S72
Journal: Vacuum - Volume 83, Supplement 1, 1 May 2009, Pages S69–S72
نویسندگان
Bronisław Psiuk, Jacek Szade, Michał Pilch, Krzysztof Szot,