TEM, XRD and DSC analysis of thin films and foils of FeSiBNb alloys doped with Mn

The FINEMET based amorphous alloys in forms of thin films of 20 ÷ 40 nm thickness and 20 μm thick foils of Fe73.5−xSi13.5B9Cu1Nb3Mnx with Mn doping (x = 11 ÷ 15 at.%), as-quenched (a-q) and after annealing (a) were analyzed with transmission electron microscopy (TEM), X-ray diffraction (XRD) and differential scanning calorimetry (DSC). The structure and composition of the films differ from those of the foils, first of all in size of crystallites and the lattice constants.