Electrical bistability studies on vacuum evaporated copper phthalocyanine (CuPc)/fullerene (C60) bilayers

• Vacuum evaporated (CuPc/C60) bilayer showed a clear electrical bistability.
• A CuPc thin film single layer device showed the absence of bistability.
• No significant degradation of the organic materials and interfaces was observed.
• ON/OFF resistance ratio was as high as 105 for the CuPc/C60 memory cell.

In this paper, electrical bistability of ITO/copper phthalocyanine (CuPc)/fullerene (C60)/Al structure for organic memory applications was studied. X-ray diffraction studies on the deposited film showed crystallinity with a major peak (100) for CuPc. It was seen that the stored conductivity state was rather stable in ITO/CuPc/C60/Al for use in organic memory cells. ON/OFF resistance ratio of around 105 was obtained for the CuPc/C60 device. Electrical bistability of this CuPc/C60 bilayer device was explained on the basis of filling of the traps and double injection.

Current voltage characteristics for the CuPc/C60 memory device and a CuPc thin film (inset).Figure optionsDownload as PowerPoint slide