Effects of annealing on structural and electrical properties of sub-micron thick CIGS films

► We have studied the properties of sub-micron thick CIGS with varied annealing times. ► Sub-micron thick CIGS films were deposited by single-stage co-evaporation. ► Increased annealing time led to improved surface morphology and grain size. ► In the XRD patterns, the CIGS films also showed improved crystal quality. ► Annealing of sub-micron thick CIGS at optimized time can be improved an efficiency.