کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1787846 | 1023453 | 2006 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Spectroscopic ellipsometry study of Ir(ppy)3 organic light emitting diode
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Spectroscopic ellipsometry study of Ir(ppy)3 organic light emitting diode Spectroscopic ellipsometry study of Ir(ppy)3 organic light emitting diode](/preview/png/1787846.png)
چکیده انگلیسی
We studied the optical properties of fac tris(2-phenylpyridine) iridium (Ir(ppy)3) emitting layer in single-layer organic light emitting diode (OLED) device and in thin film grown on quartz plate using a phase modulated spectroscopic ellipsometry (PMSE). Accurate spectra of refractive index n and extinction coefficient k of Ir(ppy)3 were obtained in the wavelength range of 330–830 nm in the device and film. Difference was observed in the n and k spectra between the single layer thin film evaporated on quartz plate and OLED. Additionally difference was found between the layer thickness estimated by quartz oscillator and thickness estimated from the PMSE measurement.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Current Applied Physics - Volume 6, Issue 5, September 2006, Pages 833–838
Journal: Current Applied Physics - Volume 6, Issue 5, September 2006, Pages 833–838
نویسندگان
Nataliya Nabatova-Gabain, Yoko Wasai, Taiju Tsuboi,