کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1787854 | 1023453 | 2006 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Influence of nanometer-size interface roughness on light transmission in polyfluorene waveguides studied by amplified spontaneous emission measurements
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موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
Amplified spontaneous emission from optically pumped thin-film waveguides of poly(9,9-dioctylfluorene) (F8) has been measured to study the influence of interface roughness on transmission loss within F8 waveguides. It is found that the transmission loss coefficient at the emission wavelength is reduced with increasing thickness of the waveguides. A theoretical model is employed to explain the relationship between the transmission loss of F8 waveguides and their thickness. The model explains the relationship found experimentally. A major source of loss is shown to be due to nanometer-size interface roughness of F8 waveguides. Such information is valuable for the design of organic solid-state lasers.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Current Applied Physics - Volume 6, Issue 5, September 2006, Pages 882-886
Journal: Current Applied Physics - Volume 6, Issue 5, September 2006, Pages 882-886
نویسندگان
Hideaki Takahashi, Hiroyoshi Naito,