کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1788499 | 1524162 | 2008 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Dependence of the electrical properties of stabilized a-Se on the preparation conditions and the development of a double layer X-ray detector structure
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Stabilized a-Se films deposited at sufficiently low substrate temperatures are n-like in which electrons can drift but holes are deeply trapped. Such layers can be conveniently incorporated in a multilayer a-Se detector structure to block the injection of holes from the positive electrode. We have shown that a simple double-layer detector structure based on a cold deposited n-layer (which is then annealed) on which an i-like layer is grown can have dark current densities lower than 10â10 A cmâ2 at a field of 10 V/μm. The dark current depends on the thickness of the n-like layer. An a-Se X-ray detector for slot scanning was fabricated by having the i-n a-Se photoconductor structure coated onto a CCD chip. The latter detector was shown to have excellent resolution with a modulation transfer function remaining above 0.5 up to a spatial frequency of 11-14 lp mmâ1.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Current Applied Physics - Volume 8, Issues 3â4, May 2008, Pages 383-387
Journal: Current Applied Physics - Volume 8, Issues 3â4, May 2008, Pages 383-387
نویسندگان
George Belev, Safa Kasap, J.A. Rowlands, David Hunter, Martin Yaffe,