کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1788509 | 1524162 | 2008 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Transmission electron microscopy without aberrations: Applications to materials science
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موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
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چکیده انگلیسی
Aberration correction leads to a substantial improvement in the directly interpretable resolution of transmission electron microscopes. Direct electron optical correction based on a hexapole corrector and indirect computational analysis of a focal or tilt series of images offer complementary approaches and a combination of the two provides additional advantages. This paper describes aberration corrected instrumentation installed in Oxford which is equipped with correctors for both the image-forming and probe-forming lenses. Examples of the use of these instruments in the characterisation of nanocrystalline catalysts are given together with initial results combining direct and indirect methods.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Current Applied Physics - Volume 8, Issues 3–4, May 2008, Pages 425–428
Journal: Current Applied Physics - Volume 8, Issues 3–4, May 2008, Pages 425–428
نویسندگان
Angus Kirkland, Lan-Yun Chang, Sarah Haigh, Crispin Hetherington,