SECM-based automate equipped with a shearforce detection for the characterization of large and complex samples

The implementation of non-optical shearforce detection for electrode positioning in SECM-based automate is described. This automate was applied to the visualization of reactive defects in a large and complex metal sample. This new setup allows measuring profile in the mm range while keeping high resolution for both electrochemical measurement and profile determination.

► Shearforce detection for SECM-based Automate.
► Application to scanning large and complex samples.
► Simultaneous profile and electrochemical measurements.
► The sample profile can be in the mm range and the resolution of the analysis can be in the μm range.