کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1803047 1024609 2008 4 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Electron back scattered diffraction study of SmCo magnets
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم فیزیک ماده چگال
پیش نمایش صفحه اول مقاله
Electron back scattered diffraction study of SmCo magnets
چکیده انگلیسی

The remanence and energy product of permanent magnets is a strong function of their crystallographic texture. Electron back scattered diffraction (EBSD) is a tool for texture analysis providing information about the atomic layers up to 50 nm below the surface of the material. This paper discusses experimental requirements for performing EBSD measurements on rare-earth permanent magnets and presents results on commercial SmCo magnet material. EBSD measurements proved to be very sensitive to misaligned grains and were sensitive to texture in good agreement with information provided by X-ray diffraction scans. Results for nanostructured Sm(CoFeCuZr)z magnets are also discussed.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Journal of Magnetism and Magnetic Materials - Volume 320, Issue 14, July 2008, Pages e77–e80
نویسندگان
, , , ,