کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1822333 | 1526346 | 2015 | 9 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
The TITAN in-trap decay spectroscopy facility at TRIUMF
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
ابزار دقیق
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چکیده انگلیسی
This paper presents an upgraded in-trap decay spectroscopy apparatus which has been developed and constructed for use with TRIUMF׳s Ion Trap for Atomic and Nuclear science (TITAN). This device consists of an open-access electron-beam ion-trap (EBIT), which is surrounded radially by seven low-energy planar Si(Li) detectors. The environment of the EBIT allows for the detection of low-energy photons by providing backing-free storage of the radioactive ions, while guiding charged decay particles away from the trap centre via the strong (up to 6 T) magnetic field. In addition to excellent ion confinement and storage, the EBIT also provides a venue for performing decay spectroscopy on highly charged radioactive ions. Recent technical advancements have been able to provide a significant increase in sensitivity for low-energy photon detection, towards the goal of measuring weak electron-capture branching ratios of the intermediate nuclei in the two-neutrino double beta (2νββ) decay process. The design, development, and commissioning of this apparatus are presented together with the main physics objectives. The future of the device and experimental technique are discussed.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 780, 21 April 2015, Pages 91-99
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 780, 21 April 2015, Pages 91-99
نویسندگان
K.G. Leach, A. Grossheim, A. Lennarz, T. Brunner, J.R. Crespo López-Urrutia, A.T. Gallant, M. Good, R. Klawitter, A.A. Kwiatkowski, T. Ma, T.D. Macdonald, S. Seeraji, M.C. Simon, C. Andreoiu, J. Dilling, D. Frekers,