کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1822512 | 1526342 | 2015 | 8 صفحه PDF | دانلود رایگان |

• A passive alignment method for obtaining a precisely measured dose map is developed.
• The SIFT-flow algorithm is adopted as an image registration method for the gel dosimeter.
• The SIFT-flow algorithm increases the gamma pass rate from 83.39% to 94.03% for the single-field irradiation.
• The SIFT-flow algorithm increases the gamma pass rate from 87.36% to 94.34% for the five-field irradiation.
• The translation, scaling, and rotation in the measured dose map image are aligned with those in the TPS image using the SIFT-flow algorithm.
One of the problems in obtaining quality results is image registration when a gel dosimeter is used in conjunction with optical computed tomography (CT). This study proposes a passive alignment mechanism to obtain a precisely measured dose map. A holder plate with two pin–hole pairs is placed on the gel container cap. These two pin–hole pairs attach the gel container to the vertical shaft and can be precisely aligned with the rotation center of the vertical shaft at any time. Accordingly, a better reconstructed image quality is obtained. After obtaining a precisely measured dose map, the scale invariant feature transform (SIFT)-flow algorithm is utilized as an image registration method to align the treatment plan software (TPS) image with the measured dose map image. The results show that the gamma pass rate for the single-field irradiation increases from 83.39% to 94.03% when the algorithm is applied. And the gamma pass rate for the five-field irradiation treatment plan increases from 87.36% to 94.34%. The translation, scaling, and rotation occurring in the dose map image constructed using an optical CT scanner are also aligned with those in the TPS image using the SIFT-flow algorithm. Accordingly, improved gamma comparison results and a higher gamma pass rate are obtained.
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Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 784, 1 June 2015, Pages 542–549