کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1823333 1526422 2013 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
CMOS APS detector characterization for quantitative X-ray imaging
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم ابزار دقیق
پیش نمایش صفحه اول مقاله
CMOS APS detector characterization for quantitative X-ray imaging
چکیده انگلیسی

An X-ray Imaging detector based on CMOS Active Pixel Sensor and structured scintillator is characterized for quantitative X-ray imaging in the energy range 11–30 keV. Linearity, dark noise, spatial resolution and flat-field correction are the characteristics of the detector subject of investigation. The detector response, in terms of mean Analog-to-Digital Unit and noise, is modeled as a function of the energy and intensity of the X-rays. The model is directly tested using monochromatic X-ray beams and it is also indirectly validated by means of polychromatic X-ray-tube spectra. Such a characterization is suitable for quantitative X-ray imaging and the model can be used in simulation studies that take into account the actual performance of the detector.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 703, 1 March 2013, Pages 26–32
نویسندگان
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