کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1823977 | 1027321 | 2012 | 10 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Area detector corrections for high quality synchrotron X-ray structure factor measurements
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
ابزار دقیق
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Area detector corrections for high quality synchrotron X-ray structure factor measurements Area detector corrections for high quality synchrotron X-ray structure factor measurements](/preview/png/1823977.png)
چکیده انگلیسی
Correction procedures for obtaining accurate X-ray structure factors from large area detectors are considered, including subpanel effects, over excited pixels and careful intensity corrections. Problems associated with data normalization, the use of a pixel response correction from a glass standard and minimization of systematic errors are also discussed. Data from glassy GeSe2 and liquid water measured with a Perkin Elmer amorphous-Silicon detector are used to demonstrate the effectiveness of these correction procedures. This requires reduction of systematic errors in the measured intensity to around the 0.1% level.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 662, Issue 1, 11 January 2012, Pages 61–70
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 662, Issue 1, 11 January 2012, Pages 61–70
نویسندگان
Lawrie B. Skinner, Chris J. Benmore, John B. Parise,