Characterization of polarization phenomenon in Al-Schottky CdTe detectors using a spectroscopic analysis method

CdTe radiation detectors equipped with Schottky contacts are known to show spectral response degradation over time under biasing. Nevertheless, they can be used as high-resolution spectrometers for X-rays and gamma-rays with moderate cooling and high voltage. Spectroscopic long-term measurements have been performed with Al/CdTe/Pt pixel detectors of 0.5, 1 and 2 mm thicknesses and 241Am source from −13 to +16 °C to evaluate how long they can be operated. Experimental results are confronted to simulations using the charge accumulation model for electric field. Activation energy for collection efficiency stability and peak shift was measured at 1.0-1.2 eV although deep acceptor levels responsible for hole detrapping during polarization were evaluated by other methods at EV +0.6-0.8 eV. The difference is probably due to a thermal effect of pre-polarization before biasing the detector.