ChromAIX: Fast photon-counting ASIC for Spectral Computed Tomography

X-ray attenuation properties of matter (i.e. human body in medical Computed Tomography) are energy and material dependent. This dependency is largely neglected in conventional CT techniques, which require the introduction of correction algorithms in order to prevent image artefacts. The exploitation of the inherent energy information contained in the X-ray spectrum allows distinguishing the two main physical causes of energy-dependent attenuation (photo-electric effect and Compton effect). Currently a number of methods exist that allow assessing the energy-dependent attenuation in conventional systems. These methods consist of using two distinct spectra (kVp switching or dual source) or of discriminating low and high energy photons by means of stacking two detectors. Further improvements can be achieved by transitioning to direct-conversion technologies and counting-mode detection, which inherently exhibits a better signal-to-noise ratio. Further including energy discrimination enables new applications, which are not feasible with dual-energy techniques, e.g. the possibility to discriminate K-edge features (contrast agents, e.g. gadolinium) from other contributions to the X-ray attenuation of a human body. The capability of providing energy-resolved information with two or more independent measurements is referred to as Spectral CT.A new proprietary photon-counting ASIC (ChromAIX) has been developed to provide high count-rate capabilities while offering energy discrimination. ChromAIX consists of a pixel array with an isotropic pitch of 300 μm. Each pixel contains independent discriminators that enable the possibility to discretize the incoming photons into a number of energy levels. Extensive electrical characterization has been carried out to assess the performance in terms of count-rate performance and noise. Observed rates exceed 10 Mcps/pixel (Poissonian, mean incoming rates >27 Mcps). The energy resolution is better than 4.1 keV FWHM and has been shown to be consistent with the simulations. First measurement with X-rays have also been carried out on samples directly flip-chip bonded to CdTe and CZT crystals. The pulse shape and spectrum obtained from a 241Am source is consistent with the simulations.