کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1825194 1027357 2011 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Testing of surface properties pre-rad and post-rad of n-in-p silicon sensors for very high radiation environment
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم ابزار دقیق
پیش نمایش صفحه اول مقاله
Testing of surface properties pre-rad and post-rad of n-in-p silicon sensors for very high radiation environment
چکیده انگلیسی

We are developing n+-in-p, p-bulk and n-readout, microstrip sensors as a non-inverting radiation hard silicon detector for the ATLAS Tracker Upgrade at the super LHC experiment. The surface radiation damages of the sensors fabricated by Hamamatsu Photonics are characterized on the interstrip capacitance, interstrip resistance and punch-through protection evolution. The detector should provide acceptable strip isolation, exceeding the input impedance of the signal readout chip ∼1 kΩ, after the integrated luminosity of 6 ab−1, which is twice the luminosity goal.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 636, Issue 1, Supplement, 21 April 2011, Pages S111–S117
نویسندگان
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