Development of a new two-dimensional position-sensitive detection based on resistive charge division and using CdTe detectors for a high-resolution semiconductor-based PET scanning

A new position-sensitive detection technique for semiconductor detector fabrication was developed for a high-spatial-resolution PET scanner with CdTe detectors. We constructed a two-dimensional sensitive CdTe detector with a size of 20×9.5×1.0 mm3, of which one side had 1 mm wide resistive strip anodes. Using our method, we succeeded in obtaining a linear presentation of a two-dimensional detection image from a distorted detection image. We showed that the detection positioning within a width of 1.2 mm for the x-axis was obtained with a confidence level of 0.98, and a spatial resolution of approximately 1 mm FWHM was obtained for the y-position. Our newly developed position-sensitive detector will enable the construction of a high-performance PET scanner due to the detector's high spatial resolution and good sensitivity; such a PET scanner is now under construction in our laboratory.