کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1825622 1027366 2010 10 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Application of Si-strip technology to X-ray diffraction instrumentation
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم ابزار دقیق
پیش نمایش صفحه اول مقاله
Application of Si-strip technology to X-ray diffraction instrumentation
چکیده انگلیسی
We describe the successful technology transfer of High Energy Physics (HEP) silicon-strip detectors for tracking of minimum ionising particles (MIPS) to industrial X-ray diffraction instruments. In our application the detector is used to measure 1-D intensity profiles of low-energy photons. The challenges of such an application are low noise because of the relatively low energy of X-ray photons, from 5 to 22 keV, and high count rate capability. The technical implementation, with a focus on custom designed front-end electronics and optimisation of strip geometry taking into account the charge division effects, is shown and the achieved performance is summarized. The detector was launched several years ago and we report on the in-field experience. Lastly, we describe several scientific applications.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 624, Issue 2, 11 December 2010, Pages 350-359
نویسندگان
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