DEPFET sensor with intrinsic signal compression developed for use at the XFEL free electron laser radiation source

A new DEPFET detector-amplifier structure with strongly non-linear characteristics is presented. It will be used as basic element of an X-ray pixel detector at the new XFEL free electron laser radiation source to be constructed in Hamburg, Germany, providing at the same time single X-ray photon detection and high dynamic range even when operated at readout frequency up to 5 MHz. This is possible due to the new detector concept that adds to the excellent DEPFET properties – combined function of detector amplifier and data storage, full sensitivity over whole bulk, non-destructive readout, low serial noise and absence of reset noise – the new features of very large charge handling capability and signal compression. Concept and design will be presented and properties demonstrated by extended computer simulations.