کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1826638 | 1526472 | 2010 | 5 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
An LTP stitching procedure with compensation of instrument errors: Comparison of SOLEIL and ESRF results on strongly curved mirrors
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
ابزار دقیق
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
Unknown linearity errors of long trace profilers (LTP) are a troublesome source of measurement errors and discrepancies from instrument to instrument, especially on strongly curved surfaces. This article describes a complete procedure of LTP data acquisition and data processing, which allow to, simultaneously, evaluate the linearity error and reconstruct a corrected slope profile. The method has been tested by performing independent measurements of the same mirrors on SOLEIL and ESRF LTP. Results show that independent measurements using this procedure are in agreement down to 0.2 μrad RMS in slope and 1.6 nm in height.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 616, Issues 2–3, 1 May 2010, Pages 207–211
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 616, Issues 2–3, 1 May 2010, Pages 207–211
نویسندگان
François Polack, Muriel Thomasset, Sylvain Brochet, Amparo Rommeveaux,