Development of double-scattering-type Compton camera with double-sided silicon strip detectors and NaI(Tl) scintillation detector

In the present study, a double-scattering-type Compton camera, which incorporates two double-sided silicon strip detectors (DSSDs) as the scatterer detectors and an NaI(Tl) detector as the absorber detector, was constructed as a proof-of-principle system for a compact high-imaging-resolution Compton camera. The energy and timing resolutions of the component detectors were determined accurately for effective Compton imaging. Then, the Compton camera was used to image an 22Na point source at 3.7 cm. The imaging resolutions of the current system were 9.0 and 4.8 mm FWHM for 511 and 1275 keV, respectively, which are fairly good considering the limitations of the detectors and data acquisition (DAQ) electronics employed. Given the characteristics of the component detectors, it is believed that the double-scattering Compton camera can be developed as a very compact system (similar in size to a hand-held radiation survey meter) providing very high imaging resolution.