کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1827150 | 1526469 | 2010 | 4 صفحه PDF | دانلود رایگان |
![عکس صفحه اول مقاله: A model of the reflection distribution in the vacuum ultra violet region A model of the reflection distribution in the vacuum ultra violet region](/preview/png/1827150.png)
A reflection model with three components, a specular spike, a specular lobe and a diffuse lobe is discussed. This model was successfully applied to describe reflection of xenon scintillation light (λ=175nm) by PTFE and other fluoropolymers and can be used for Monte Carlo simulation and analysis of scintillation detectors. The measured data favor a Trowbridge–Reitz distribution function of ellipsoidal micro-surfaces. The intensity of the coherent reflection increases with increasing angle of incidence, as expected, since the surface appears smoother at grazing angles. The total reflectance obtained for PTFE is about 70% for VUV light at normal incidence in vacuum and estimated to go up to 100% in contact with liquid xenon, depending of the angle.
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 619, Issues 1–3, 1–21 July 2010, Pages 59–62