A DAQ system for pixel detectors R&D

Pixel detector R&D for HEP and imaging applications require an easily configurable and highly versatile DAQ system able to drive and read out many different chip designs in a transparent way, with different control logics and/or clock signals. An integrated, real-time data collection and analysis environment is essential to achieve fast and reliable detector characterization. We present a DAQ system developed to fulfill these specific needs, able to handle multiple devices at the same time while providing a convenient, ROOT based data display and online analysis environment.