On the efficiency of photon emission during electrical breakdown in silicon

This paper presents a study of photons that are emitted during electrical breakdown in p–n silicon diodes. The method that was developed for this study uses the optical-crosstalk effect that is observed in Geigermode-APD (G-APD) photon detectors. The outcome of this study is twofold: firstly, mainly photons with energies between 1.15 and 1.4 eV contribute to the optical crosstalk in G-APDs used in this study. This observation is explained by the strong energy dependence of the absorption length of photons in silicon. Secondly, the intensity with which photons with energies between 1.15 and 1.4 eV are emitted during a breakdown is 3×10-53×10-5 photons per charge carrier in the breakdown region. The uncertainty of the intensity is estimated to be a factor of two. For this study a simulation package Siliconphotomultiplier Simulator (SiSi) was developed, which can be used to address various other questions that arise in the application of G-APDs.