کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1828247 | 1526480 | 2009 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Characterization of spatial homogeneity of sensitivity and radiation resistance of semiconductor detectors in the soft X-ray range
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موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
ابزار دقیق
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Characterization of spatial homogeneity of sensitivity and radiation resistance of semiconductor detectors in the soft X-ray range Characterization of spatial homogeneity of sensitivity and radiation resistance of semiconductor detectors in the soft X-ray range](/preview/png/1828247.png)
چکیده انگلیسی
We at Siberian Synchrotron Radiation Center (Novosibirsk) have conducted comparative studies of spatial homogeneity of sensitivity and radiation resistance of semiconductor detectors SPD-100UV developed by the Physical Technical Institute (St. Petersburg) as well as AXUV-100 (made by IRD Inc., USA). These works were carried out at the “Cosmos” station on the VEPP-4 storage ring in the soft X-ray range (80-1000Â eV).
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 603, Issues 1â2, 11 May 2009, Pages 58-61
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 603, Issues 1â2, 11 May 2009, Pages 58-61
نویسندگان
P.N. Aruev, Yu.M. Kolokolnikov, N.V. Kovalenko, A.A. Legkodymov, V.V. Lyakh, A.D. Nikolenko, V.F. Pindyurin, V.L. Sukhanov, V.V. Zabrodsky,