Noise and radiation damage in silicon photomultipliers exposed to electromagnetic and hadronic radiation

For the electron arm tracking system in the KAOS spectrometer at the Mainz Microtron MAMI a detector based on 2 m long scintillating fibres read out by silicon photomultipliers (SiPM) is planned. Because of the detector's close proximity to the intense electron beam a study of noise and radiation damage in SiPM has been performed. A sample of devices was exposed directly to a 14 MeV electron beam and to a mixed radiation field in the experimental area. First noticeable effects are a large increase in the dark count rate and a severe loss of the gain uniformity.