کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
1828849 1526489 2008 7 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Radiation hardness properties of full-3D active edge silicon sensors
موضوعات مرتبط
مهندسی و علوم پایه فیزیک و نجوم ابزار دقیق
پیش نمایش صفحه اول مقاله
Radiation hardness properties of full-3D active edge silicon sensors
چکیده انگلیسی
After 8.6×1015 n1 MeVeq cm−2 the signal collected was ∼38% and corresponded to ∼7200e− for a substrate thickness of 235 μm. Signal efficiency, radiation-induced leakage current and related damage parameters are discussed here and compared with simulations. Full-3D silicon detectors with active edges are being considered for forward proton tagging at the LHC, for the ATLAS pixel B-layer replacement and for the ATLAS pixel upgrade.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 587, Issues 2–3, 21 March 2008, Pages 243-249
نویسندگان
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