کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1829617 | 1027462 | 2007 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Comparison of two methods for simulation of hard X-ray nanofocusing by elliptical mirrors
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موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
ابزار دقیق
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Wave-optical calculations are essential for predicting the X-ray focusing performance of precisely figured elliptical mirrors. The complex wavefield in the vicinity of the focal plane of a mirror with RMS height error in the nanometer range compared to the best-fit ellipse has been calculated using two methods. A pupil function method that treats the surface topography of a mirror as an aberration to a perfect ellipse was used to obtain the reflected amplitude and phase around the focal point downstream. The results were compared with direct propagation of waves from a point source, and it was found that both methods were in good agreement. Each approach provides advantages that are useful in designing mirrors to achieve diffraction limited focusing.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 582, Issue 1, 11 November 2007, Pages 138-141
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 582, Issue 1, 11 November 2007, Pages 138-141
نویسندگان
Cameron M. Kewish, Albert T. Macrander, Lahsen Assoufid, Jun Qian,