Comparison of Monte Carlo-simulated scattering processes of low-energy photons in radiation detector materials

Monte Carlo simulations for interaction processes of low-energy (25–32 keV) X-ray photons with different solid-state radiation detector materials are presented in this paper. It was found that the fraction of scattered photons, corresponding to scattered dose, in all investigated detector materials (LiF, Si, polycrystalline and amorphous diamond-like materials, Al2O3) was significant enough to influence the value of the patient's/ phantom's entrance surface dose, caused by the low-energy X-ray exposure, which is commonly used in mammography examinations. The influence of scattering processes to the total dose registration using different constructions of the detectors and the optimization of detector parameters are discussed on the basis of modelling results.