Extraction methods of phase information for X-ray diffraction enhanced imaging

X-ray diffraction enhanced imaging (DEI) is one of X-ray phase-contrast imaging methods, which is applied to inspect internal structures of weakly absorbing low-Z samples. The key problem of the DEI is how to extract phase information which is expressed by refraction-angle images from a series of DEI images measured in different positions of the rocking curve of the analyzer. Three effective extraction methods are presented in this paper: the statistical geometric-optics-approximation method, the maximum refraction-angle method and the Gaussian curve fitting method. They are compared with the existing methods, such as the D. Chapman's geometric optics approximation method and the multiple-images statistical method. A 2D computer simulation experiment is performed to draw comparisons of these methods. The experimental results prove that the above three methods have more precision of refraction-angle values than existing methods.