A detector system for studying nuclear reactions relevant to Single Event Effects

We describe a device to study reactions relevant for the Single Event Effect (SEE) in microelectronics by means of 200 A and 300 A MeV, inverse kinematics, Si+HSi+H and Si+DSi+D reactions. The work is focused on the possibility to measure Z=2–14Z=2–14 projectile fragments as efficiently as possible. During commissioning and first experiments the fourth quadrant of the CELSIUS storage ring acted as a spectrometer to register fragments in two planes of Si strip detectors in the angular region 0∘–0.6∘0∘–0.6∘. A combination of ring-structured and sector-structured Si strip detector planes operated at angles 0.6∘–1.1∘0.6∘–1.1∘. For specific event tagging a Si++ phoswich scintillator wall operated in the range 3.9∘–11.7∘3.9∘–11.7∘ and Si ΔE–EΔE–E telescopes of CHICSi type operated at large angles.