کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
1831765 | 1027504 | 2006 | 7 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Beam-test of CMOS pixel sensors with 6Â GeV electrons
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
فیزیک و نجوم
ابزار دقیق
پیش نمایش صفحه اول مقاله

چکیده انگلیسی
CMOS monolithic pixel sensors have emerged in recent years as a viable option for particle tracking applications at high-energy physics experiments. Their capability of integrating the sensing element, the first readout and the processing electronics on the same substrate allows the fabrication of highly segmented sensors which provide an excellent spatial resolution with a minimum material budget. In this study, a reticle-size prototype, featuring more than 1 million pixels distributed over an area of 3.5cm2, has been tested in a series of beam-tests with the 6Â GeV electron beam of the DESY-II synchrotron in DESY (Hamburg, Germany). The detector tracking capabilities have been studied with the aid of a silicon reference telescope. Results are presented concerning the sensor charge collection properties, detection efficiency and spatial resolution as a function of the operational temperature and of the electron beam energy.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 565, Issue 1, 1 September 2006, Pages 119-125
Journal: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment - Volume 565, Issue 1, 1 September 2006, Pages 119-125
نویسندگان
D. Contarato, M. Adamus, J. Ciborowski, E. Fretwurst, T. Haas, J. Hauschildt, R. Klanner, U. Kötz, B. Löhr, C. Muhl, A. Polini, J. Sztuk, A. Tyszkiewicz, W. Zeuner,