Radiation chemical yields for the losses of typical functional groups in PADC films for high energy protons registered as unetchable tracks

• Modified structure of unetchable proton tracks in PADC is examined against the stopping power.
• The reducing behavior of ether and carbonated ester bonds are on the same trends to that of heavy ions.
• The decreasing trend of CH groups is different from that of heavy ions.
• Some different features on radiation chemistry are found on the both sides of the threshold of etch pit formation.

A series of FT-IR spectrometric studies has been performed to understand the latent track structure in poly(allyl diglycol carbonate), PADC, which were exposed to proton beams with energies of 20, 30 and 70 MeV. These energies are too high to register etchable tracks in PADC. Chemical damage parameters, such as damage density, effective track core radius and radiation chemical yields, for losses of ether bond, carbonate ester bond and CH groups in PADC are evaluated as a function of the stopping power, which were compared to the previous results for 5.7 MeV proton and heavy ions, between He and Xe. Graphs of the chemical damage parameters are given at the wide stopping powers ranging from 1 to 12,000 keV/μm. The decreasing behaviors of the ether and carbonate ester bonds are on the almost identical trends with those of the heavy ions. On the contrary to this, the reducing behavior of CH groups is similar to that of the gamma rays. Different dependence of the chemical damage parameters for the loss of CH groups is found on the stopping powers between the both sides of the detection threshold as an etched track detector.