کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
379354 | 659292 | 2008 | 18 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Detection and prediction of errors in EPCs of the SAP reference model
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کلمات کلیدی
موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
هوش مصنوعی
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Detection and prediction of errors in EPCs of the SAP reference model Detection and prediction of errors in EPCs of the SAP reference model](/preview/png/379354.png)
چکیده انگلیسی
Up to now there is neither data available on how many errors can be expected in process model collections, nor is it understood why errors are introduced. In this article, we provide empirical evidence for these questions based on the SAP reference model. This model collection contains about 600 process models expressed as Event-driven Process Chains (EPCs). We translated these EPCs into YAWL models, and analyzed them using the verification tool WofYAWL. We discovered that at least 34 of these EPCs contain errors. Moreover, we used logistic regression to show that complexity of EPCs has a significant impact on error probability.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Data & Knowledge Engineering - Volume 64, Issue 1, January 2008, Pages 312–329
Journal: Data & Knowledge Engineering - Volume 64, Issue 1, January 2008, Pages 312–329
نویسندگان
J. Mendling, H.M.W. Verbeek, B.F. van Dongen, W.M.P. van der Aalst, G. Neumann,