کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
388216 660920 2009 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
An improved pattern match method with flexible mask for automatic inspection in the LCD manufacturing process
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر هوش مصنوعی
پیش نمایش صفحه اول مقاله
An improved pattern match method with flexible mask for automatic inspection in the LCD manufacturing process
چکیده انگلیسی

This research examines the electrical conductive particles of anisotropic conductive film (ACF) during the laminate manufacturing process for liquid crystal displays (LCD) and adopts an improved pattern match method to apply on-line automatic and relevant measurement inspections.The focus of this research is describing and identifying feature images. We aim to improve the traditional pattern match methods including the gray scale designs, adaptive pattern matrix, and adaptive feature weight pattern to reduce the system function errors and to enable more efficient and quicker pattern searches and matches for full-size images.

ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Expert Systems with Applications - Volume 36, Issue 2, Part 2, March 2009, Pages 3234–3239
نویسندگان
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