کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
4971565 | 1450524 | 2017 | 12 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Enabling robust automotive electronic components in advanced CMOS nodes
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
![عکس صفحه اول مقاله: Enabling robust automotive electronic components in advanced CMOS nodes Enabling robust automotive electronic components in advanced CMOS nodes](/preview/png/4971565.png)
چکیده انگلیسی
In this work, we have demonstrated that many elements are needed on top of conventional foundry reliability knowledge to enable robust automotive products in compliance with all restrictive norms. For intrinsic reliability, both reliability models (a design compatible WLR description), and dynamic aging compensation schemes are required. For extrinsic failures, screening procedures require well documented usage and are shown in use for volume production to bring the failure rate level down below 1Â ppm automotive target. Altogether, the global approach developed in STMicroelectronics enable robust automotive products based on controlled and validated procedures.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volumes 76â77, September 2017, Pages 13-24
Journal: Microelectronics Reliability - Volumes 76â77, September 2017, Pages 13-24
نویسندگان
V. Huard, S. Mhira, F. Cacho, A. Bravaix,