کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
4971569 1450524 2017 5 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
Improved and accurate physics-of-failure (PoF) methodology for qualification and lifetime assessment of electronic systems
موضوعات مرتبط
مهندسی و علوم پایه مهندسی کامپیوتر سخت افزارها و معماری
پیش نمایش صفحه اول مقاله
Improved and accurate physics-of-failure (PoF) methodology for qualification and lifetime assessment of electronic systems
چکیده انگلیسی
In this paper, we propose a methodology that combines the two approaches to get an improved reliability estimation and allows for a gradual improvement from a prediction handbook based approach to a PoF based reliability assessment. This methodology has been successfully validated on an industrial case.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volumes 76–77, September 2017, Pages 42-46
نویسندگان
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