RF measurements to pinpoint defects in inkjet-printed, thermally and mechanically stressed coplanar waveguides

The results showed that the line width of 670 μm had better signal performance and better long-term reliability than the line width of 250 μm. In this study, the average limit for proper RF operation was 2500 thermal cycles with both line geometries. The wide CPW lines provided more stable characteristics than the narrow CPW lines for the whole 10,000-cycle duration of the test, combined with repeated bending with a maximum bending radius of 6 mm. A phenomenon of nanoparticle silver protruding from cracks in the print of the bent samples was observed, as well as fracturing of the silver print in the CPW lines.