کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
4971853 | 1450536 | 2016 | 4 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
Static logic state analysis by TLS on powered logic circuits: Three case studies for suspected stuck-at failure modes
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موضوعات مرتبط
مهندسی و علوم پایه
مهندسی کامپیوتر
سخت افزارها و معماری
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چکیده انگلیسی
Thermal Laser Stimulation (TLS) for static logic state analysis is applied to failure analysis. Three case studies of analyses of the digital logic in an automotive Application Specific Integrated Circuit (ASIC) are discussed. By analyzing the logic states of the circuit we were able to identify the mechanism and localize the site of irregular behavior non-destructively, both for a stuck-at fault and two weak interconnects. The approach measures the power supply current while applying TLS to the device back side. This allows an extremely high analysis coverage, because every transistor is connected to the power supply, making this method a universal tool for every digital circuit failure analysis (FA) workflow, because the gained understanding of the fault allows to replace multiple steps of alternative FA techniques by only a single technique, reducing time and cost for successful FA.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: Microelectronics Reliability - Volume 64, September 2016, Pages 306-309
Journal: Microelectronics Reliability - Volume 64, September 2016, Pages 306-309
نویسندگان
C. Helfmeier, E. Friess, J. Glueck,