کد مقاله | کد نشریه | سال انتشار | مقاله انگلیسی | نسخه تمام متن |
---|---|---|---|---|
5005499 | 1369035 | 2006 | 6 صفحه PDF | دانلود رایگان |
عنوان انگلیسی مقاله ISI
New device and method for measuring thermal conductivity of thin-films
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موضوعات مرتبط
مهندسی و علوم پایه
سایر رشته های مهندسی
کنترل و سیستم های مهندسی
پیش نمایش صفحه اول مقاله
چکیده انگلیسی
Thermal sensitive paints (TSPs) are used for global nonintrusive detection of boundary layer transition in flow over the surface of wind tunnel research models. Since the transition is a transient process, the TSP should have a fast response characteristic. A low paint thermal conductivity is required for fast response. A thin-film thermal conductivity meter (TFTCM) was designed and built to measure thermal conductivity of the TSPs, which are typically between 50 and 150/μm thick. In this paper, the design and operating features of the TFTCM are described. Measurement of the thermal conductivity with this TFTCM of three standard thin-film low conductivity specimens, Kapton, Teflon, and Borofloat glass, showed good agreement with the manufacturer quoted values, thus validating the instrument and the procedure. Consistently repeatable values for thermal conductivity (k=0.41±0.02 W/mK) were also obtained for the TSP specimen (TSB-B, 75 /μm) tested.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: ISA Transactions - Volume 45, Issue 3, July 2006, Pages 313-318
Journal: ISA Transactions - Volume 45, Issue 3, July 2006, Pages 313-318
نویسندگان
Chelakara S. Subramanian, Tahani Amer, Billy T. UpChurch, David W. Alderfer, Cecil Burkett, Bradley Sealey,