کد مقاله کد نشریه سال انتشار مقاله انگلیسی نسخه تمام متن
5005499 1369035 2006 6 صفحه PDF دانلود رایگان
عنوان انگلیسی مقاله ISI
New device and method for measuring thermal conductivity of thin-films
موضوعات مرتبط
مهندسی و علوم پایه سایر رشته های مهندسی کنترل و سیستم های مهندسی
پیش نمایش صفحه اول مقاله
New device and method for measuring thermal conductivity of thin-films
چکیده انگلیسی
Thermal sensitive paints (TSPs) are used for global nonintrusive detection of boundary layer transition in flow over the surface of wind tunnel research models. Since the transition is a transient process, the TSP should have a fast response characteristic. A low paint thermal conductivity is required for fast response. A thin-film thermal conductivity meter (TFTCM) was designed and built to measure thermal conductivity of the TSPs, which are typically between 50 and 150/μm thick. In this paper, the design and operating features of the TFTCM are described. Measurement of the thermal conductivity with this TFTCM of three standard thin-film low conductivity specimens, Kapton, Teflon, and Borofloat glass, showed good agreement with the manufacturer quoted values, thus validating the instrument and the procedure. Consistently repeatable values for thermal conductivity (k=0.41±0.02 W/mK) were also obtained for the TSP specimen (TSB-B, 75 /μm) tested.
ناشر
Database: Elsevier - ScienceDirect (ساینس دایرکت)
Journal: ISA Transactions - Volume 45, Issue 3, July 2006, Pages 313-318
نویسندگان
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